CONCERN NANOINDUSTRY
Institute for Nanotechnologies of the International Conversion Foundation (INAT ICF)

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DEVICE FOR SHARPENING PROBES
OF TUNNELING MICROSCOPES 

The device fulfils sharpening tungsten probes (needles)
for tunneling microscopes with electro chemical method
at automatic process interruption control.

 

 

 

DESCRIPTION

We offer the "Device for Sharpening Probes" (DSP) for tunneling (including scanning) microscopes used for studying surfaces at atomic-molecular level developed and delivered by the Institute for Nanotechnologies of the International Conversion Foundation (INAT ICF).

Basic technical characteristics:


Tungsten wire diameter
0.2 0.5 mm
Sharpened probe appearance at 10 μm scale
Probe sharpening time depending on wire diameter
1 5 minutes
Sharpened probe radius
Up to 30 nm
System operation mode setting time
Up to 30 seconds
Напряжение питающей электросети
220V 10%
Voltage supply
up to 20 Вт
Operation mode
Etching with
automatic current switching-off

Safety regulations
demand fulfilling etching of probes using standard exhaust system. Etching process is fulfilled in KOH solution.

 

Advantages of DSP

  • Possibility of sharpening probes at various wire diameter

  • Automatic current switching-off

  • The probe is placed into container

  • The device does not require high qualification for work.


Kitting

  • Device for sharpening probes;

  •  LEVENHUK D2L digital microscope (magnification 40X to 400X; possibility of computer control);

  • LEVENHUK C35 digital camera (resolution of 350 К pixels);

 
  • Electrodes for etching;

  • Cassettes for probes;

  • 2 auxiliary vessels; Tungsten wire in amount of 2 m;

  • User's manual;

  • Data sheet.

Please forward your orders on delivery of probes sharpening facility via e-mail: mailto:info2@nanotech.ru
 
 
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Updated 11.02.2011